Method And Device For Measuring The Thickness And

专利名称：Method And Device For Measuring The

Thickness And The Electrical Conductivity OfAn Object Of Measurement

发明人：Sten Linder申请号：US10585111申请日：20041222

公开号：US20070273371A1公开日：20071129

专利附图：

摘要：A method for non-contact measurement of a dimension and/or an electricalproperty in an electrically conducting object to be measured by using electromagnetic

induction. An electromagnetic field is brought to penetrate through the object to bemeasured. A transmitter coil is place on one side of the object to be measured. A receivercoil is placed on the other side of the object to be measured. A magnetic field isgenerated in the transmitter coil. A sudden change is generated in the magnetic fieldgenerated in the transmitter coil from one level to another. The voltage induced in thereceiver coil is detected. The period of time that elapses from the time of the change ofthe magnetic field in the transmitter coil up to the time when a voltage starts to beinduced in the receiver coil is determined. The magnitude of the induced voltage isdetermined. The thickness and/or electrical conductivity of the object to be measured iscalculated.

申请人：Sten Linder

地址：Vasteras SE

国籍：SE

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