专利名称：Measuring and controlling the thickness of a
coating on an elongated article
发明人：Atkins, Robert M.,Peterson, George
E.,Tuminaro, Raymond D.
申请号：EP90307968.9申请日：19900720公开号：EP0416729A2公开日：19910313
摘要：A method for manufacturing a coated optical fiber includes depositing aconductive coating on the optical fiber and measuring a value of conductance of thatcoating. Featured within the manufacturing method is a method for measuring thethickness of the conductive coating on an insulator, e.g., carbon on an optical fiber,including the following steps. An electromagnetic field is established by an input signal.The conductively coated insulator is moved through the energized electromagnetic field.The conductive coating on the insulator is oriented with respect to the electric field sothat their interaction increases transmission loss from input to output. An output signal isextracted from the electromagnetic field. From changes in the output signal with respectto a predetermined standard, or reference, the conductance and the thickness of theconductive coating are determined. From the measured thickness of the coating, acontrol signal is generated for dynamically controlling one or more of the processparameters for depositing the coating on the insulator from a precursor gas. The coatedinsulator continuously moves through the apparatus without any physical contact. Nointerruption of the production process occurs.
申请人：AT&T Corp.
地址：32 Avenue of the Americas New York, NY 10013-2412 US
国籍：US
代理机构：Johnston, Kenneth Graham
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