专利名称：Arrangement for measuring the reflection
and/or transmission of an object
发明人：Van Hijningen, Nicolaas Cornelis Josephus
Antonius,Van Nimwegen, Cornelis JohannesMaria,Verhoeven, Johannes AlbertusTheodorus
申请号：EP92200302.5申请日：19920204公开号：EP0499312A1公开日：19920819
专利附图：
摘要：An arrangement for measuring the reflection and/or transmission of an objectcomprises a frame 1, a carrier 7 for the object, a radiation source 15 and a detector unit.The detector unit, which comprises one or more radiation-sensitive detectors 17A, 17Bmay be arranged on a holder 13 which is pivotable about a pivotal axis 13a. A slide 5,which is movable parallel to the pivotal axis, may be provided for moving the carrier andthe detector unit rectilinearly towards and away from one another.
申请人：Philips Electronics N.V.
地址：Groenewoudseweg 1 5621 BA Eindhoven NL
国籍：NL
代理机构：Schrijnemaekers, Hubert Joannes Maria
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